OMG researchers use the electron channelling contrast imaging (ECCI) method on a variety of materials systems. We thought it would be a useful resource if we put together a Collection of papers related to the technique on the ScienceOpen platform. We've recently updated this set of papers. You will also find two of 'Editorials' giving brief notes on (i) some papers that mark contributions to the development of the technique over the past 50+ years, and (ii) more recent works demonstrating the capability of the technique on modern FEG-SEMs.
The 'ECCI Collection' includes papers on electron channelling patterns (ECPs) which show the variation of electron signal (typically the back scattered electron intensity) with incident beam direction which reveal the crystallography of the sample, and electron channelling contrast images (ECCIs) which show the spatial variation of the selected signal and reveal local defects in the crystal lattice.
The methods were conceived in the 1960s, and there have been several periods of active research over the intervening decades. The performance of current SEMs makes the method an attractive alternative to TEM for routine diffraction contrast imaging and characterisation of lattice defects in crystalline samples.
The collection is will grow over the next months - please get in touch with other papers to add.
