Front Cover of Journal of Microscopy

Have belatedly realised our work was on the front cover of Journal of Microscopy in September last year. The front cover image shows dislocations threading through a GaN layer grown from a patterned substrate. The dislocations are revealed through channelling contrast using signal integrated from the low take-off angle region of an array of EBSD patterns. The paper describes how images revealling different features of the sample can be generated from the stack of EBSD patterns. The microscopy and data collection was carried out by Arrantxa Vilalta-Clemente while Aimo Winkelmann (Bruker Nano) analysed the data and rendered the images.