Electron back scatter diffraction patterns are used to measure the orientations of individual grains and grain boundary misorientations in polycrystals. Within the group the technique is used widely (i) to characterize overall statistics of grain size and orientation distributions, (ii) to select specific grain boundary types for subsequent micromechanical testing, and (iii) for mapping lattice curvature and strains within individual grains and semiconductor devices. (strain mapping with CrossCourt4 from BLG Productions)
